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 2SK2727
Silicon N Channel MOS FET High Speed Power Switching
ADE-208-526 A 2nd. Edition Features
* * * * Low on-resistance High speed switching Low drive current Avalanche ratings
Outline
TO-3P
D
G
1
S
2
3
1. Gate 2. Drain (Flange) 3. Source
2SK2727
Absolute Maximum Ratings (Ta = 25C)
Item Drain to source voltage Gate to source voltage Drain current Drain peak current Body to drain diode reverse drain current Avalanche current Avalanche energy Channel dissipation Channel temperature Storage temperature Notes: 1. PW 10s, duty cycle 1 % 2. Value at Tc = 25C 3. Value at Tch = 25C, Rg 50 Symbol VDSS VGSS ID I D(pulse)* I DR I AP *
3 3 2 1
Ratings 500 30 10 40 10 10 5.55 100 150 -55 to +150
Unit V V A A A A mJ W C C
EAR*
Pch* Tch Tstg
2
2SK2727
Electrical Characteristics (Ta = 25C)
Item Drain to source breakdown voltage Gate to source breakdown voltage Gate to source leak current Zero gate voltege drain current Symbol V(BR)DSS V(BR)GSS I GSS I DSS Min 500 30 -- -- 2.5 -- 4.2 -- -- -- -- -- -- -- -- -- -- -- -- Typ -- -- -- -- -- 0.75 7.0 1100 330 65 21 5 8 20 70 55 50 1.0 300 Max -- -- 10 10 3.5 0.95 -- -- -- -- -- -- -- -- -- -- -- -- -- Unit V V A A V S pF pF pF nc nc nc ns ns ns ns V ns I D = 10A, VGS = 0 I F = 10A, VGS = 0 diF/ dt = 100A/s Test Conditions I D = 10mA, VGS = 0 I G = 100A, VDS = 0 VGS = 25V, VDS = 0 VDS = 500 V, VGS = 0 I D = 1mA, VDS = 10V*1 I D = 5A, VGS = 10V*1 I D = 5A, VDS = 10V*1 VDS = 10V VGS = 0 f = 1MHz VDD = 400V VGS = 10V I D = 10A VGS = 10V, ID = 5A RL = 6
Gate to source cutoff voltage VGS(off) Static drain to source on state RDS(on) resistance Forward transfer admittance Input capacitance Output capacitance |yfs| Ciss Coss
Reverse transfer capacitance Crss Total gate charge Gate to source charge Gate to drain charge Turn-on delay time Rise time Turn-off delay time Fall time Body to drain diode forward voltage Body to drain diode reverse recovery time Note: 1. Pulse test Qg Qgs Qgd t d(on) tr t d(off) tf VDF t rr
See characteristics curves of 2SK2726
3
2SK2727
Main Characteristics
Power vs. Temperature Derating 200 Pch (W) I D (A) 100 30 10 3 1 0.3 0.1 0.03 0.01 0 50 100 150 Tc (C) 200 1 Case Temperature Ta = 25 C 30 3 10 100 300 1000 Drain to Source Voltage V DS (V)
DC
Maximum Safe Operation Area
10
PW
Op er at
10
0 s
s
150
1
= 10
(T
m
s
Channel Dissipation
Drain Current
100
ion
ms
c=
(1
sh
)
Operation in this area is limited by R DS(on)
ot)
25 C
50
Dynamic Input Characteristics Gate to Source Voltage V GS (V) Repetive Avalanche Energy E AR (mJ) V DS (V) 500 V DS V DD = 100 V 250 V 400 V V GS 200 I D = 10 A V DD = 400 V 250 V 100 V 8 16 24 32 Gate Charge Qg (nc) 8 20
Maximum Avalanche Energy vs. Channel Temperature Derating 10 I AP = 10 A V DD = 50 V duty < 1 % Rg > 50
400
16
8
Drain to Source Voltage
300
12
6
4
100
4 0 40
2 0 25
0
50
75
100
125
150
Channel Temperature Tch (C)
4
2SK2727
Avalanche Test Circuit EAR = Avalanche Waveform 1 2 * L * I AP * 2 VDSS VDSS - V DD
V DS Monitor
L I AP Monitor
V (BR)DSS I AP VDD ID V DS
Rg Vin 15 V
D. U. T
50 0 VDD
Normalized Transient Thermal Impedance vs. Pulse Width 3 Normalized Transient Thermal Impedance s (t) Tc = 25C 1 D=1 0.5
0.3
0.2
0.1
0.1
0.05
ch - c(t) = s (t) * ch - c ch - c = 1.25 C/W, Tc = 25 C
PDM PW T
0.03
0.02 1 lse 0.0 t pu ho 1s
D=
PW T
0.01 10
100
1m
10 m 100 m Pulse Width PW (S)
1
10
5
2SK2727
Switching Time Test Circuit Vin Monitor D.U.T. RL Vin Vin 10 V 50 V DD = 30 V Vout 10% 10% 90% td(on) tr 90% td(off) tf 10% Vout Monitor Switching Time Waveforms
90%
6
2SK2727
Package Dimensions
Unit: mm
5.0 0.3 3.2 0.2 0.5 typ 16.0 max 1.0 typ 5.0 max 1.5 typ
14.9 0.2
2.0 typ
20.1 max
1.6 typ 1.4 max 2.0 typ 18.0 0.5 2.8 typ
1.0 0.2 3.6 typ 0.9 typ 1.0 typ
0.6 0.2
0.3 typ
5.45 0.2
5.45 0.2
Hitachi Code EIAJ JEDEC
TO-3P SC-65 --
7
Cautions
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi's or any third party's patent, copyright, trademark, or other intellectual property rights for information contained in this document. Hitachi bears no responsibility for problems that may arise with third party's rights, including intellectual property rights, in connection with use of the information contained in this document. 2. Products and product specifications may be subject to change without notice. Confirm that you have received the latest product standards or specifications before final design, purchase or use. 3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However, contact Hitachi's sales office before using the product in an application that demands especially high quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment or medical equipment for life support. 4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as failsafes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other consequential damage due to operation of the Hitachi product. 5. This product is not designed to be radiation resistant. 6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without written approval from Hitachi. 7. Contact Hitachi's sales office for any questions regarding this document or Hitachi semiconductor products.
Hitachi, Ltd.
Semiconductor & Integrated Circuits. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109
URL
NorthAmerica : http:semiconductor.hitachi.com/ Europe : http://www.hitachi-eu.com/hel/ecg Asia (Singapore) : http://www.has.hitachi.com.sg/grp3/sicd/index.htm Asia (Taiwan) : http://www.hitachi.com.tw/E/Product/SICD_Frame.htm Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm Japan : http://www.hitachi.co.jp/Sicd/indx.htm For further information write to:
Hitachi Semiconductor (America) Inc. 179 East Tasman Drive, San Jose,CA 95134 Tel: <1> (408) 433-1990 Fax: <1>(408) 433-0223 Hitachi Europe GmbH Electronic components Group Dornacher Strae 3 D-85622 Feldkirchen, Munich Germany Tel: <49> (89) 9 9180-0 Fax: <49> (89) 9 29 30 00 Hitachi Europe Ltd. Electronic Components Group. Whitebrook Park Lower Cookham Road Maidenhead Berkshire SL6 8YA, United Kingdom Tel: <44> (1628) 585000 Fax: <44> (1628) 778322 Hitachi Asia Pte. Ltd. 16 Collyer Quay #20-00 Hitachi Tower Singapore 049318 Tel: 535-2100 Fax: 535-1533 Hitachi Asia Ltd. Taipei Branch Office 3F, Hung Kuo Building. No.167, Tun-Hwa North Road, Taipei (105) Tel: <886> (2) 2718-3666 Fax: <886> (2) 2718-8180 Hitachi Asia (Hong Kong) Ltd. Group III (Electronic Components) 7/F., North Tower, World Finance Centre, Harbour City, Canton Road, Tsim Sha Tsui, Kowloon, Hong Kong Tel: <852> (2) 735 9218 Fax: <852> (2) 730 0281 Telex: 40815 HITEC HX
Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.


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